Eric M. Olson
at Quantum3D Inc
SPIE Involvement:
Author
Publications (23)

Proceedings Article | 12 September 2003 Paper
Proc. SPIE. 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
KEYWORDS: Infrared sensors, Visualization, Sensors, Image processing, Computer simulations, Image sensors, Projection systems, Light sources and illumination, Infrared radiation, RGB color model

Proceedings Article | 31 August 2001 Paper
Proc. SPIE. 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
KEYWORDS: Nonuniformity corrections, Mid-IR, Cameras, Calibration, Projection systems, Field effect transistors, Resistors, Radiometric resolution, Cryogenics, Temperature metrology

Proceedings Article | 31 August 2001 Paper
Proc. SPIE. 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
KEYWORDS: Nonuniformity corrections, Point spread functions, Sensors, Calibration, Black bodies, Projection systems, Resistors, Medium wave, Frame grabbers, Floods

Proceedings Article | 31 August 2001 Paper
Proc. SPIE. 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
KEYWORDS: Thermography, Infrared imaging, Calibration, Signal processing, Black bodies, Projection systems, Infrared radiation, Field effect transistors, Resistors, Temperature metrology

Proceedings Article | 31 August 2001 Paper
Proc. SPIE. 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
KEYWORDS: Signal to noise ratio, Diffraction, Point spread functions, Cameras, Sensors, Image processing, Error analysis, Projection systems, Convolution, Analytical research

Showing 5 of 23 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top