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Ernest Grimberg
Chief Scientist at Opgal Optronic Industries Ltd
SPIE Involvement:
Author
Publications (6)
Proceedings Article | 15 October 2005 Paper
Improvement of EVS II over EVS I
Proceedings Volume 5964, 59640P (2005) https://doi.org/10.1117/12.634393
KEYWORDS: Sensors, Cameras, Signal to noise ratio, Signal detection, Fiber optic gyroscopes, Head, Enhanced vision, Nonuniformity corrections, Temperature metrology, Erbium
Proceedings Article | 30 August 2004 Paper
Design considerations for radiometer based on uncooled microbolometer detector
Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.557350
KEYWORDS: Sensors, Temperature metrology, Cameras, Nonuniformity corrections, Microbolometers, Signal detection, Signal processing, Modulation transfer functions, Mathematical modeling, Video
Proceedings Article | 5 August 2004 Paper
Real-time control of uncooled microbolometer camera transfer function
Proceedings Volume 5407, (2004) https://doi.org/10.1117/12.558772
KEYWORDS: Signal to noise ratio, Cameras, Modulation transfer functions, Sensors, Video, Digital signal processing, Microbolometers, Linear filtering, Optical filters, Signal processing
Proceedings Article | 19 February 2004 Paper
Adaptive transfer function concept for uncooled FLIR cameras
Proceedings Volume 5251, (2004) https://doi.org/10.1117/12.516505
KEYWORDS: Signal to noise ratio, Cameras, Modulation transfer functions, Sensors, Optical filters, Digital signal processing, Signal processing, Forward looking infrared, Video, Signal detection
Proceedings Article | 7 July 2002 Paper
Optics and Dewar head temperature influence on FLIR performances
Proceedings Volume 4820, (2002) https://doi.org/10.1117/12.452229
KEYWORDS: Sensors, Temperature metrology, Forward looking infrared, Nonuniformity corrections, Cameras, Data modeling, Head, Signal detection, Microbolometers, Optics manufacturing
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Conference Committee Involvement (4)
Detectors and Associated Signal Processing V
27 November 2012 | Barcelona, Spain
Detectors and Associated Signal Processing IV
5 September 2011 | Marseille, France
Detectors and Associated Signal Processing
4 September 2008 | Glasgow, Scotland, United Kingdom
Detectors and Associated Signal Processing II
13 September 2005 | Jena, Germany
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