Esmaeil Heidari
Lead Optical Systems Engineeri
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 28 August 2016 Presentation + Paper
Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Moire patterns, Fringe analysis, Visualization, Cameras, Solar cells, Manufacturing, Deflectometry, 3D metrology, Optical alignment, Neodymium

Proceedings Article | 20 September 2013 Paper
Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II
KEYWORDS: Confocal microscopy, Metrology, Imaging systems, Sensors, Surface roughness, Colorimetry, Motion measurement, Radium, Surface finishing, Edge roughness

Proceedings Article | 19 February 2013 Paper
Proc. SPIE. 8659, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIV
KEYWORDS: 3D image reconstruction, Imaging systems, Cameras, Image resolution, Lens design, 3D modeling, 3D metrology, Modulation transfer functions, 3D image processing, Structured light

Proceedings Article | 20 November 2012 Paper
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Confocal microscopy, Imaging systems, Calibration, Light scattering, Manufacturing, Laser scattering, Surface roughness, Colorimetry, Optical interferometry, Surface finishing

Proceedings Article | 14 September 2011 Paper
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Infrared imaging, Sensors, Crystals, Ions, Inspection, Wafer inspection, Associative arrays, Neodymium, Semiconducting wafers, 3D image processing

Showing 5 of 6 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top