Dr. Euan Ramsay Profile

Dr. Euan Ramsay

Systems Engineer at Thermofisher Scientific

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Author

Publications (5)

Proceedings Article | 17 September 2018 Presentation + Paper

Optic design and manufacturing issues of a high numerical broadband IR solid immersion microscope objective

Thomas Sure, Prasad Sabbineni, Euan Ramsay

Proceedings Volume 10745, 107450J (2018) https://doi.org/10.1117/12.2321312

KEYWORDS: Glasses, Objectives, Tolerancing, Silicon, Solids, Refractive index, Optics manufacturing, Manufacturing, Transistors, Charged particle optics

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Proceedings Article | 26 January 2009 Paper

Nano-optical studies of superconducting nanowire single-photon detectors

Robert Hadfield, Paul Dalgarno, John O'Connor, Euan Ramsay, Richard Warburton, Eric Gansen, Burm Baek, Martin Stevens, Richard Mirin, Sae Woo Nam

Proceedings Volume 7236, 72360G (2009) https://doi.org/10.1117/12.819360

KEYWORDS: Superconductors, Single photon detectors, Silicon, Inductance, Avalanche photodetectors, Solids, Confocal microscopy, Microscopes, Continuous wave operation, Nanowires

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SPIE Journal Paper | 1 December 2008

Solid immersion lens applications for nanophotonic devices

Keith Serrels, Euan Ramsay, Paul Dalgarno, Brian Gerardot, John O'Connor, Robert Hadfield, Richard Warburton, Derryck Reid

JNP, Vol. 2, Issue 01, 021854, (December 2008) https://doi.org/10.1117/12.10.1117/1.3068652

KEYWORDS: Solids, Microscopy, Silicon, Spatial resolution, Near field optics, Refractive index, Point spread functions, Semiconductors, Imaging systems, Image resolution

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Proceedings Article | 28 February 2006 Paper

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Dong Xiao, Euan Ramsay, Bernd Offenbeck, Norbert Weber, Derryck Reid

Proceedings Volume 6108, 61080H (2006) https://doi.org/10.1117/12.645640

KEYWORDS: Silicon, Optical parametric oscillators, CMOS devices, Harmonic generation, Photodiodes, Signal detection, Femtosecond phenomena, Photomultipliers, Sensors, Near infrared

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Proceedings Article | 28 February 2006 Paper

Silicon flip-chip imaging with a resolution of 325-nm using solid-immersion lenses and the two-photon optical-beam induced current method

Euan Ramsay, Nicholas Pleynet, Dong Xiao, Richard Warburton, Derryck Reid

Proceedings Volume 6108, 61080G (2006) https://doi.org/10.1117/12.645629

KEYWORDS: Image resolution, Silicon, Refractive index, Microscopes, Absorption, Solids, Objectives, Semiconductor lasers, Two photon imaging, Metals

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