Dr. Ewan McGhee
at Imperial College London
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 August 2006 Paper
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Metrology, Imaging systems, Calibration, Image segmentation, Image processing, Particles, Wavefront sensors, Wavefronts, 3D metrology, 3D image processing

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