Prof. Eytan Barouch
at Boston Univ
SPIE Involvement:
Author
Publications (52)

Proceedings Article | 28 April 2023 Paper
Proceedings Volume 12494, 124940K (2023) https://doi.org/10.1117/12.2659099
KEYWORDS: Binary data, Interpolation, Extreme ultraviolet, Matrices, Semiconducting wafers, Nanoimprint lithography, Diffraction, Computer programming, Mathematical optimization, Source mask optimization

Proceedings Article | 26 March 2019 Paper
Proceedings Volume 10957, 109571D (2019) https://doi.org/10.1117/12.2515079
KEYWORDS: Deep ultraviolet, Extreme ultraviolet lithography, Finite-difference time-domain method, Extreme ultraviolet, Computer simulations, Lithography, Computational electromagnetics

Proceedings Article | 24 March 2017 Paper
Proceedings Volume 10143, 101431P (2017) https://doi.org/10.1117/12.2258188
KEYWORDS: Extreme ultraviolet lithography, Critical dimension metrology, Optical lithography, Optical proximity correction, EUV optics, Photomasks, Wafer-level optics, Reflectivity, Semiconducting wafers, Extreme ultraviolet

Proceedings Article | 26 September 2016 Paper
Proceedings Volume 9985, 99850G (2016) https://doi.org/10.1117/12.2242999
KEYWORDS: Pellicles, Extreme ultraviolet, Optical lithography, Critical dimension metrology, Extreme ultraviolet lithography, Photomasks, Lead, Lithography, Contamination, Neodymium

SPIE Journal Paper | 1 August 2016
JM3, Vol. 15, Issue 03, 033504, (August 2016) https://doi.org/10.1117/12.10.1117/1.JMM.15.3.033504
KEYWORDS: Photomasks, Semiconducting wafers, Critical dimension metrology, Optical lithography, Extreme ultraviolet lithography, Reflectivity, Imaging systems, Logic, Semiconductors, Applied physics

Showing 5 of 52 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top