Failop Chu
Applications Engineer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 February 2006 Paper
Failop Chu, R. Guidash, J. Compton, S. Coppola, W. Hintz
Proceedings Volume 6069, 606903 (2006) https://doi.org/10.1117/12.641773
KEYWORDS: Photodiodes, Signal to noise ratio, Image quality, Sensors, Image resolution, CMOS sensors, Standards development, CMOS technology, Diffusion, Image sensors

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