Laser diodes and diode laser bars are key components in high power semiconductor lasers and solid state laser systems.
During manufacture, the assembly of the fast axis collimation (FAC) lens is a crucial step. The goal of our activities is to
design an automated assembly system for high volume production. In this paper the results of an intermediate milestone
will be reported: a demonstration system was designed, realized and tested to prove the feasibility of all of the system
components and process features. The demonstration system consists of a high precision handling system, metrology for
process feedback, a powerful digital image processing system and tooling for glue dispensing, UV curing and laser
operation. The system components as well as their interaction with each other were tested in an experimental system in
order to glean design knowledge for the fully automated assembly system. The adjustment of the FAC lens is performed
by a series of predefined steps monitored by two cameras concurrently imaging the far field and the near field intensity
distributions. Feedback from these cameras processed by a powerful and efficient image processing algorithm control a
five axis precision motion system to optimize the fast axis collimation of the laser beam. Automated cementing of the
FAC to the diode bar completes the process. The presentation will show the system concept, the algorithm of the
adjustment as well as experimental results. A critical discussion of the results will close the talk.
In optoelectronics diode lasers and especially diode laser bars are playing an important role for applications in high
power diode lasers as well as diode laser pumped solid state lasers. Inside the manufacturing process of laser bar systems
the electro optical test of laser bars is essential to sort out the good parts which fulfil the quality specified.
An electro optical test station was developed and integrated which performs the so called LIV test. The voltage vs.
current, the intensity vs. current and spectral distribution of each of the emitters can be measured and logged. The results
will be evaluated and according to flexible parameter management the decision about acceptable quality is supplied
automatically. The data will be processed by data base capabilities, hence this the system can be integrated into the
general manufacturing data management.
Due to the modular design of the test station it is capable to be integrated in a fully automated visual inspection and test
system suitable for mass production as well as in a semi automated system which fits more the demands of R&D
applications. The design of the test station, test results and a critical discussion of advantages will be presented.
System integrators are driven by the demands of hybrid module manufacturers to provide machines with a higher
degree of system integration while maintaining full process automation at max. throughput and yield. The full automated packaging process involves Pick&Place of several components like photo diode, laser sub-mount, integrated optical chip and PCB. Whereby some components are placed passively supported by vision inspection and some are aligned actively by closing a control loop on nano-scale precision. The system applies adhesive bonding for
fixation of the components.
The presentation shows how various assembly steps are combined in one machine concept for assembling and qualifying complex hybrid modules. Therefore modern assembly machines relay to special hardware designs i.e. for trays, chucks, motion concepts and calibration systems as well as for software features as data base interfaces, recipe
controlled processes and flexible process editor. However beside hardware and software feasibility also necessary device
characterisation is an important feature in assembly machines.
Conference Committee Involvement (2)
Photonics Packaging, Integration, and Interconnects IX
26 January 2009 | San Jose, California, United States
Photonics Packaging, Integration, and Interconnects VIII
22 January 2008 | San Jose, California, United States
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print format on
SPIE.org.