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Feng Yan
at Cambridge Univ
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Publications (1)
Proceedings Article | 16 May 2003 Paper
AC measurement for characterizing the trap processes in poly-silicon TFTs
Feng Yan, Piero Migliorato, Tatsuya Shimoda
Proceedings Volume 5004, (2003) https://doi.org/10.1117/12.473884
KEYWORDS: Electrons, Signal detection, Capacitance, Amplifiers, Glasses, Electronic circuits, Thin film devices, Thin films, Transistors, Technologies and applications
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