Dr. Fermín Salomón Granados-Agustín
Research at INAOE
SPIE Involvement:
Author
Area of Expertise:
OPTICAL TESTING , INTERFEROMETRY
Profile Summary

Fermín Granados-Agustín is a researcher with the Optics Department of the National Institute of Astrophysics, Optics, and Electronics INAOE, Mexico. He received his BS degree in physics from the National University of Mexico UNAM in 1993. He received his MS degree and PhD degree in optics, respectively in 1995 and 1998, both from the INAOE. He is a national researcher for the National System of Researches, Mexico. He held a postdoctoral position at the Mirror Lab of the Steward Observatory at the University of Arizona in 1999. He has been the head of the optical shop at INAOE since 2005. His research interests include optical information, Interferometric optical testing, and instrumentation.
Publications (67)

Proceedings Article | 21 August 2020 Poster + Paper
Proc. SPIE. 11482, Current Developments in Lens Design and Optical Engineering XXI
KEYWORDS: Optical components, Monochromatic aberrations, Telescopes, Mirrors, Optical design, Modulation transfer functions, Freeform optics, Optimization (mathematics), Optical instrument design

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Cameras, Image processing, Photography, Wavefronts, Numerical simulations, Deflectometry, Refraction, Zernike polynomials, Aspheric lenses, Spherical lenses

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Monochromatic aberrations, Telescopes, Mirrors, Optical design, Ray tracing, Geometrical optics, Freeform optics, Optical instrument design, Optics manufacturing

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Detection and tracking algorithms, Visualization, Sensors, Wavefronts, Phase retrieval, Wave propagation, Geometrical optics, Beam propagation method, Light wave propagation

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Light sources, Point diffraction interferometers, Cadmium, Interferometers, Manufacturing, Interferometry, Wavefronts, Distance measurement, Aspheric lenses, Spherical lenses

Showing 5 of 67 publications
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