Prof. Fionn D. Murtagh
Director of Information and Communications Technology at Science Foundation Ireland
SPIE Involvement:
Author | Instructor
Publications (22)

Proceedings Article | 3 June 2005 Paper
Proc. SPIE. 5826, Opto-Ireland 2005: Optical Sensing and Spectroscopy
KEYWORDS: Refractive index, Light emitting diodes, Roads, Reflection, Physics, Bioalcohols, Computer science, Life sciences, Surface properties, Liquids

Proceedings Article | 1 June 2005 Paper
Proc. SPIE. 5823, Opto-Ireland 2005: Imaging and Vision
KEYWORDS: Semiconductors, Data mining, Statistical analysis, Data modeling, Visualization, Spectroscopy, Computer science, Raman spectroscopy, Software development, Algorithm development

Proceedings Article | 1 June 2005 Paper
Proc. SPIE. 5823, Opto-Ireland 2005: Imaging and Vision
KEYWORDS: Image processing algorithms and systems, Wavelet transforms, Biomedical optics, Magnetic resonance imaging, Image segmentation, Wavelets, 3D modeling, Medical imaging, Positron emission tomography, 3D image processing

Proceedings Article | 1 June 2005 Paper
Proc. SPIE. 5823, Opto-Ireland 2005: Imaging and Vision
KEYWORDS: Electronics, Statistical analysis, Magnetic resonance imaging, Image segmentation, Error analysis, Distortion, Image registration, Computed tomography, Statistical modeling, Image information entropy

Proceedings Article | 1 June 2005 Paper
Proc. SPIE. 5823, Opto-Ireland 2005: Imaging and Vision
KEYWORDS: Mathematical modeling, Data mining, Statistical analysis, Data modeling, Visualization, Raman spectroscopy, Data acquisition, Data processing, Mining, Software development

Showing 5 of 22 publications
Proceedings Volume Editor (4)

SPIE Conference Volume | 1 June 2005

SPIE Conference Volume | 19 December 2002

SPIE Conference Volume | 1 November 2001

Conference Committee Involvement (4)
Imaging and Vision
5 April 2005 | Dublin, Ireland
Optical Metrology,Imaging, and Machine Vision
5 September 2002 | Galway, Ireland
Astronomical Data Analysis II
27 August 2002 | Waikoloa, Hawai'i, United States
Astronomical Data Analysis
2 August 2001 | San Diego, CA, United States
Course Instructor
SC137: Multiscale Analysis Methods in Astronomy and Engineering
Multiscale analysis methods, including wavelet transforms, used for image enhancement, faint feature recognition, image content characterization and fusion are presented in this material. Embedded applications in object detection, image database operations, image and signal compression and transmission, and process control are also discussed. This course explains how image and signal processing methods are used in science operations, product development and visual inspection.
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