Fook Loong Chin
OPC Solutions Engineer at Spansion Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 16 March 2009 Paper
Proceedings Volume 7274, 727435 (2009) https://doi.org/10.1117/12.814354
KEYWORDS: Optical proximity correction, Chemically amplified resists, Calibration, Data modeling, Diffusion, Semiconducting wafers, Image enhancement, Optical resolution, Optical lithography, Image analysis

Proceedings Article | 7 March 2008 Paper
Proceedings Volume 6924, 69242V (2008) https://doi.org/10.1117/12.773049
KEYWORDS: SRAF, Image processing, Lithography, Optical lithography, Photomasks, Atrial fibrillation, Error analysis, Manufacturing, Optical proximity correction, Electroluminescence

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top