X-ray dark-field imaging is used to visualize the ultra-small angle x-ray scattering signal that originates from sub-resolution density fluctuations within the sample microstructure. Dark-field tomography using the edge-illumination x-ray imaging system is presented as a tool for measuring this scattering signal in a sample in three dimensions. Its applicability to different fields is shown through example images of a multi-material phantom, a tissue-engineered esophagus, a pouch cell battery and a short-fiber reinforced composite material. The multichannel contrast available in edge-illumination helps with material identification, with high contrast at boundaries enhancing dark-field reconstructions.
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