Dr. Françoise Bridou
Research Engineer at Institut d'Optique Graduate School
SPIE Involvement:
Author
Publications (20)

SPIE Journal Paper | 17 November 2017 Open Access
Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard
OE, Vol. 56, Issue 11, 119801, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.119801

SPIE Journal Paper | 1 November 2017
Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard
OE, Vol. 56, Issue 11, 117101, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.117101
KEYWORDS: Reflectivity, Mirrors, X-rays, X-ray fluorescence spectroscopy, Interfaces, Chromium, Multilayers, Sputter deposition, Sensors, Luminescence

Proceedings Article | 26 September 2013 Paper
Franck Delmotte, Evgueni Meltchakov, Sébastien de Rossi, Françoise Bridou, Arnaud Jérome, François Varnière, Raymond Mercier, Frédéric Auchère, Xueyan Zhang, Bruno Borgo, Cydalise Dumesnil, Serge François, Marc Roulliay, Udo Strauch
Proceedings Volume 8862, 88620A (2013) https://doi.org/10.1117/12.2036050
KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Telescopes, Space telescopes, Synchrotrons, Aluminum, Mirrors, Deposition processes, Space operations

Proceedings Article | 5 October 2011 Paper
A. Ziani, F. Delmotte, C. Le Paven-Thivet, E. Meltchakov, F. Bridou, A. Jérome, M. Roulliay, K. Gasc
Proceedings Volume 8168, 81681S (2011) https://doi.org/10.1117/12.896433
KEYWORDS: Reflectivity, Aluminum, Ion beams, Mirrors, Sputter deposition, Multilayers, Extreme ultraviolet, Reflectometry, Ultraviolet radiation, X-rays

Proceedings Article | 4 October 2011 Paper
E. Meltchakov, A. Ziani, F. Auchere, X. Zhang, M. Roulliay, S. De Rossi, Ch. Bourassin-Bouchet, A. Jérome, F. Bridou, F. Varniere, F. Delmotte
Proceedings Volume 8168, 816819 (2011) https://doi.org/10.1117/12.896577
KEYWORDS: Multilayers, Reflectivity, Extreme ultraviolet, Aluminum, Silicon carbide, Silicon, X-rays, Interfaces, Synchrotron radiation, Temperature metrology

Showing 5 of 20 publications
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