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Francy Kunnel Abraham
Associate Research Fellow at Intel Corp
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Publications (2)
SPIE Journal Paper | 1 May 2011
High-speed inline profiler using a modified Fourier transform method for measuring integrated circuit surface profiles
Takeshi Nakazawa, José Sasián, Francy Abraham
OE, Vol. 50, Issue 05, 053603, (May 2011) https://doi.org/10.1117/12.10.1117/1.3574399
KEYWORDS: Fourier transforms, Integrated circuits, Computer simulations, Imaging systems, 3D metrology, Inspection, CCD cameras, Cameras, Projection systems, Optical engineering
Proceedings Article | 18 August 1997 Paper
Automated inspection in printed circuit board assembly (PCBA) manufacturing
Proceedings Volume 3185, (1997) https://doi.org/10.1117/12.284039
KEYWORDS: Inspection, Manufacturing, Optical inspection, Control systems, Lead, Materials processing, Visualization
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