Dr. Frank Rogge Profile

Dr. Frank Rogge

at Univ Ziekenhuizen Leuven

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Author

Publications (9)

Proceedings Article | 18 March 2008 Paper

A simulation framework for pre-clinical studies on dose and image quality: concept and first validation

Kristien Smans, Herman Pauwels, Frank Rogge, Lara Struelens, Octavian Dragusin, Filip Vanhavere, Hilde Bosmans

Proceedings Volume 6913, 69133G (2008) https://doi.org/10.1117/12.769442

KEYWORDS: Monte Carlo methods, Image quality, Sensors, Modulation transfer functions, X-rays, Image processing, X-ray imaging, Chromium, Computer simulations, Image filtering

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Proceedings Article | 17 March 2006 Paper

First validation of a new phantom for global quality control in digital mammography

H. Bosmans, K. Nijs, K. Young, F. Rogge, P. Morán, M. Chevalier, M. Borowski, R. van Engen, A. Taibi, J. Cook, Guy Marchal

Proceedings Volume 6146, 614612 (2006) https://doi.org/10.1117/12.655206

KEYWORDS: Digital mammography, Image analysis, Gold, Digital imaging, Prototyping, Image quality, Data processing, Sensors, X-rays, Medical imaging

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Proceedings Article | 17 March 2006 Paper

Characterization of a new generation of computed radiography system based on line scanning and phosphor needles

Octavian Dragusin, Frank Rogge, Herman Pauwels, Guy Marchal, Hilde Bosmans

Proceedings Volume 6146, 614613 (2006) https://doi.org/10.1117/12.655494

KEYWORDS: Chromium, Sensors, Signal to noise ratio, Modulation transfer functions, Image quality, X-rays, Imaging systems, Aluminum, Computing systems, Skull

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Proceedings Article | 6 May 2004 Paper

Practical MTF calculation in digital mammography: a multicenter study

Frank Rogge, Hilde Bosmans, Guy Marchal

Proceedings Volume 5368, (2004) https://doi.org/10.1117/12.535823

KEYWORDS: Modulation transfer functions, Detection and tracking algorithms, Digital mammography, Sensors, Spatial frequencies, Data modeling, Analytical research, Algorithm development, Fourier transforms, Imaging systems

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Proceedings Article | 6 May 2004 Paper

Threshold contrast visibility of microcalcifications in digital mammography

Ann-Katherine Carton, Hilde Bosmans, Dirk Vandenbroucke, Chantal Van Ongeval, Geert Souverijns, Frank Rogge, Guy Marchal

Proceedings Volume 5368, (2004) https://doi.org/10.1117/12.536298

KEYWORDS: Sensors, X-rays, Aluminum, X-ray detectors, Particles, Mammography, Polymethylmethacrylate, Modulation transfer functions, Digital mammography, Visibility

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Proceedings Article | 5 June 2003 Paper

Use of MTF calculation in global and local resolution assessment in digital mammography

Frank Rogge, Hilde Bosmans, Peter Willems, Guy Marchal

Proceedings Volume 5030, (2003) https://doi.org/10.1117/12.480008

KEYWORDS: Modulation transfer functions, Sensors, Data modeling, Digital mammography, Lead, Aluminum, Detection and tracking algorithms, X-rays, Tumor growth modeling, Polymethylmethacrylate

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Proceedings Article | 22 May 2003 Paper

Contrast visibility of simulated microcalcifications in full field mammography systems

Ann-Katherine Carton, Hilde Bosmans, Chantal Van Ongeval, Geert Souverijns, Frank Rogge, Guy Marchal

Proceedings Volume 5034, (2003) https://doi.org/10.1117/12.480092

KEYWORDS: Sensors, X-rays, Mammography, Modulation transfer functions, Breast, Visibility, Polymethylmethacrylate, Aluminum, X-ray detectors, Tissues

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Proceedings Article | 3 May 2002 Paper

Practical method for detected quantum efficiency (DQE) assessment of digital mammography systems in the radiological environment

Frank Rogge, Dirk Vandenbroucke, Luc Struye, Hilde Bosmans, Peter Willems, Guy Marchal

Proceedings Volume 4682, (2002) https://doi.org/10.1117/12.465609

KEYWORDS: Modulation transfer functions, Sensors, X-rays, Digital mammography, Signal attenuation, Quantum efficiency, X-ray detectors, Data modeling, Fourier transforms, Polymethylmethacrylate

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Proceedings Article | 30 August 1999 Paper

Fabrication of counter electrodes for scanning atomic probe

Andrew Campitelli, Hocine Ziad, Frank Rogge, Wilfried Vandervorst, Christiaan Baert, Min Huang, Alfred Cerezo

Proceedings Volume 3874, (1999) https://doi.org/10.1117/12.361214

KEYWORDS: Electrodes, Silicon, Metals, Dielectrics, Electroplating, Aluminum, Photoresist materials, Deep reactive ion etching, Semiconducting wafers, Chemical species

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Showing 5 of 9 publications

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