Dr. Fredrik Eriksson Profile

Dr. Fredrik Eriksson

at Linköping Univ.

SPIE Involvement:

Conference Program Committee | Author

Publications (6)

Proceedings Article | 21 September 2018 Presentation + Paper

Ion-assisted magnetron sputter deposition of B4C-doped Ni/Ti multilayer mirrors

Fredrik Eriksson, Naureen Ghafoor, Daniel Ostach, Norbert Schell, Jens Birch

Proceedings Volume 10760, 1076006 (2018) https://doi.org/10.1117/12.2317742

KEYWORDS: Reflectivity, Interfaces, X-rays, Multilayers, Mirrors, Sputter deposition, Modulation, Ions, Doping, Scattering

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Proceedings Article | 8 September 2005 Paper

Stability of EUV multilayers to long-term heating, and to energetic protons and neutrons, for extreme solar missions

A. Rousseau, D. Windt, B. Winter, L. Harra, H. Lamoureux, F. Eriksson

Proceedings Volume 5900, 590004 (2005) https://doi.org/10.1117/12.616469

KEYWORDS: Multilayers, Extreme ultraviolet, Annealing, Reflectivity, Sun, X-rays, Remote sensing, Particles, Telescopes, Thermal modeling

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Proceedings Article | 14 October 2004 Paper

Measurements of the optical constants of scandium in the 50-1300eV range

Andrew Aquila, Farhad Salmassi, Eric Gullikson, Fredrik Eriksson, Jens Birch

Proceedings Volume 5538, (2004) https://doi.org/10.1117/12.563615

KEYWORDS: Scandium, Reflectivity, Absorption, X-rays, Multilayers, Optical testing, Mirrors, Silicon, Refraction, Extreme ultraviolet

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SPIE Journal Paper | 1 November 2002

Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition

Fredrik Eriksson, Goeran Johansson, Hans Hertz, Jens Birch

OE, Vol. 41, Issue 11, (November 2002) https://doi.org/10.1117/12.10.1117/1.1510750

KEYWORDS: Reflectivity, Ions, X-rays, Interfaces, Argon, Chromium, Hard x-rays, Plasma, Sputter deposition, Mirrors

Proceedings Article | 20 December 2001 Paper

Enhanced soft x-ray reflectivity of Cr/Sc multilayers by ion-assisted sputter deposition

Fredrik Eriksson, Goeran Johansson, Hans Hertz, Jens Birch

Proceedings Volume 4506, (2001) https://doi.org/10.1117/12.450948

KEYWORDS: Ions, Reflectivity, X-rays, Interfaces, Argon, Multilayers, Plasma, Hard x-rays, Chromium, Sputter deposition

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Showing 5 of 6 publications

Conference Committee Involvement (2)

Advances in X-Ray/EUV Optics and Components XIX

19 August 2024 | San Diego, California, United States

Advances in X-Ray/EUV Optics and Components XVIII

22 August 2023 | San Diego, California, United States

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