Dr. Garrett D. Cole
at Thorlabs Crystalline Solutions
SPIE Involvement:
Conference Program Committee | Author
Publications (14)

Proceedings Article | 9 March 2020 Presentation
Proc. SPIE. 11264, Nonlinear Frequency Generation and Conversion: Materials and Devices XIX

Proceedings Article | 13 March 2019 Presentation
Proc. SPIE. 10901, Vertical External Cavity Surface Emitting Lasers (VECSELs) IX
KEYWORDS: Semiconductors, Resistance, Semiconductor lasers, Distributed Bragg reflectors, Thermal analysis, Silicon carbide, Disk lasers, Thermal efficiency

Proceedings Article | 1 March 2019 Paper
Proc. SPIE. 10938, Vertical-Cavity Surface-Emitting Lasers XXIII
KEYWORDS: Microelectromechanical systems, Oxides, Mirrors, Light sources, Gallium arsenide, Diffuse optical spectroscopy, Ion implantation, Vertical cavity surface emitting lasers, Tissue optics, Resistors

Proceedings Article | 26 November 2018 Presentation
Proc. SPIE. 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference
KEYWORDS: Semiconductors, Mirrors, Multilayers, Laser induced damage, Crystals, Optical coatings, Optical testing, Laser damage threshold, Laser crystals, Absorption

Proceedings Article | 19 February 2018 Paper
Proc. SPIE. 10552, Vertical-Cavity Surface-Emitting Lasers XXII
KEYWORDS: Mid-IR, Mirrors, Quantum wells, Continuous wave operation, Gallium arsenide, Gallium antimonide, Vertical cavity surface emitting lasers, Optical pumping

Showing 5 of 14 publications
Conference Committee Involvement (5)
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
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