Dr. Gary W. DeBell
at MLD Technologies LLC
SPIE Involvement:
Publications (5)

Proceedings Article | 7 February 2006 Paper
Proc. SPIE. 5991, Laser-Induced Damage in Optical Materials: 2005
KEYWORDS: Oxides, Electron beams, Sputter deposition, Metals, Ions, Optical coatings, Ion beams, Laser damage threshold, Thin film coatings, Absorption

Proceedings Article | 4 November 2003 Paper
Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
KEYWORDS: Thin films, Refractive index, Data modeling, Silica, Error analysis, Dielectrics, Transmittance, Tantalum, Thin film coatings, Absorption

Proceedings Article | 29 September 1999 Paper
Proc. SPIE. 3766, X-Ray Optics, Instruments, and Missions II
KEYWORDS: Carbon, Mirrors, Multilayers, Reflection, X-rays, Tungsten, Interfaces, Reflectivity, Structural design, X-ray technology

Proceedings Article | 1 October 1997 Paper
Proc. SPIE. 3133, Optical Thin Films V: New Developments
KEYWORDS: Thin films, Refractive index, Optical design, Multilayers, Beam splitters, Glasses, Optical coatings, Polarizers, Transmittance, Thin film coatings

Proceedings Article | 7 September 1994 Paper
Proc. SPIE. 2262, Optical Thin Films IV: New Developments
KEYWORDS: Refractive index, Optical design, Antireflective coatings, Beam splitters, Polarization, Glasses, Optical coatings, Optimization (mathematics), Thin film coatings, Dielectric polarization

Proceedings Volume Editor (2)

SPIE Conference Volume | 26 September 1978

SPIE Conference Volume | 1 March 1974

Conference Committee Involvement (2)
Optical Coatings: Applications and Utilization II
28 March 1978 | Washington, D.C., United States
Optical Coatings: Applications and Utilization I
19 August 1974 | San Diego, United States
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