George C. Goldsmith
Electronic Development Engineer at US Air Force
SPIE Involvement:
Author
Publications (20)

Proceedings Article | 16 May 2006 Paper
Proc. SPIE. 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
KEYWORDS: Digital signal processing, Logic, Clocks, Image processing, Field programmable gate arrays, Distortion, Image sensors, Mathematics, Algorithm development, Commercial off the shelf technology

Proceedings Article | 20 May 2005 Paper
Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
KEYWORDS: Electronics, Etching, Metals, Ceramics, Control systems, Photomasks, Semiconducting wafers, Body temperature, Yield improvement, Cryogenics

Proceedings Article | 20 May 2005 Paper
Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
KEYWORDS: Thermography, Infrared imaging, Electronics, Silicon, Projection systems, Bridges, Infrared radiation, Resistors, Infrared technology, Cryogenics

Proceedings Article | 4 August 2004 Paper
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Nonuniformity corrections, Cameras, Resistance, Field programmable gate arrays, Control systems, Data processing, Projection systems, Infrared radiation, Field effect transistors, Algorithm development

Proceedings Article | 4 August 2004 Paper
Proc. SPIE. 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
KEYWORDS: Nonuniformity corrections, Infrared sensors, Data modeling, Sensors, Calibration, Image processing, Time metrology, Black bodies, Projection systems, Sensor calibration

Showing 5 of 20 publications
Conference Committee Involvement (6)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
17 March 2008 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
10 April 2007 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
18 April 2006 | Orlando (Kissimmee), Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
29 March 2005 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
13 April 2004 | Orlando, Florida, United States
Showing 5 of 6 Conference Committees
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