Dr. George Vachtsevanos
at Georgia Institute of Technology
SPIE Involvement:
Publications (4)

Proceedings Article | 8 August 2003 Paper
Proc. SPIE. 5107, System Diagnosis and Prognosis: Security and Condition Monitoring Issues III
KEYWORDS: Switches, Sensors, Complex systems, Manufacturing, Diagnostics, Control systems, Feature extraction, Signal processing, Dynamical systems, Fuzzy logic

Proceedings Article | 20 July 2001 Paper
Proc. SPIE. 4389, Component and Systems Diagnostics, Prognosis, and Health Management
KEYWORDS: Data modeling, Sensors, Wavelets, Diagnostics, Control systems, Feature extraction, Data processing, Neural networks, Algorithm development, Systems modeling

Proceedings Article | 29 December 2000 Paper
Proc. SPIE. 4203, Biological Quality and Precision Agriculture II
KEYWORDS: Breast, Fluctuations and noise, Image segmentation, Image processing, X-rays, Manufacturing, Inspection, Bone, Algorithm development, X-ray imaging

Proceedings Article | 15 April 1997 Paper
Proc. SPIE. 3029, Machine Vision Applications in Industrial Inspection V
KEYWORDS: Imaging systems, Image segmentation, Image processing, Resistance, Inspection, CCD cameras, Image filtering, Radon transform, Electronic filtering, Fuzzy logic

Conference Committee Involvement (2)
Defense Transformation and Net-Centric Systems 2009
14 April 2009 | Orlando, Florida, United States
Defense Transformation and Net-Centric Systems 2008
18 March 2008 | Orlando, Florida, United States
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