Mr. Gerald Lamb Profile

Gerald Lamb

at Freescale Semiconductor Inc

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Publications (2)

Proceedings Article | 2 September 1997 Paper

Implementation of in-line Fowler-Nordheim testing for tunnel oxide thickness determination in manufacturing

Laura John, Richard Cosway, Mark Griswold, Gerald Lamb

Proceedings Volume 3215, (1997) https://doi.org/10.1117/12.284671

KEYWORDS: Oxides, Semiconducting wafers, Capacitors, Process control, Manufacturing, Dielectrics, Semiconductors, Optical testing, Wafer testing, Diffusion

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Proceedings Article | 7 October 1994 Paper

In-flight and post-flight stray radiation measurements on the Infrared Background Signature Survey (IBSS) telescope

Reinhard Birkl, Guenter Lange, Claus Boesswetter, Gerald Lamb

Proceedings Volume 2260, (1994) https://doi.org/10.1117/12.189208

KEYWORDS: Mirrors, Telescopes, Bidirectional reflectance transmission function, Space telescopes, Sensors, Contamination, Reflectivity, Radiometry, Sun, Off axis mirrors

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