Dr. Gianluigi Maggioni
at Instituto Nazionale di Fisica Nucleare
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 31 August 2022 Paper
M. G. Pelizzo, M. Padovani, A. J. Corso, G. Santi, M. Uslenghi, D. Faccini, M. Fiorini, S. Incorvaia, G. Toso, E. Fabbrica, M. Carminati, C. Fiorini, G. Favaro, M. Bazzan, G. Maggioni, G. Naletto, V. Andretta, A. Milillo
Proceedings Volume 12181, 121813G (2022) https://doi.org/10.1117/12.2633821
KEYWORDS: Exosphere, Ultraviolet radiation, Sensors, Extreme ultraviolet, Spectroscopy, Spectrographs, Planets, Microchannel plates, Photon counting, Satellites

Proceedings Article | 24 August 2021 Poster + Presentation + Paper
M. G. Pelizzo, A. J. Corso, G. Santi, M. Uslenghi, M. Fiorini, S. Incorvaia, G. Toso, E. Fabbrica, M. Carminati, C. Fiorini, G. Favaro, M. Bazzan, G. Maggioni
Proceedings Volume 11820, 118200Z (2021) https://doi.org/10.1117/12.2596137
KEYWORDS: Spectroscopy, Extreme ultraviolet, Sensors, Logic, Silicon carbide, Semiconducting wafers, Silicon, Planets, Microchannel plates, Photon counting

Proceedings Article | 16 May 2007 Paper
Michele Tonezzer, Gianluigi Maggioni, Katerina Severova, Sara Carturan, Alberto Quaranta, Gianantonio Della Mea
Proceedings Volume 6585, 65850X (2007) https://doi.org/10.1117/12.722931
KEYWORDS: Scanning electron microscopy, FT-IR spectroscopy, Optical sensing, Statistical analysis, Molecules, Optical testing, Biological and chemical sensing, Chemical analysis, Coating, Solids

Proceedings Article | 16 May 2007 Paper
Katerina Severova, Gianluigi Maggioni, Stanislav Nespurek, Sara Carturan, Riccardo Milan, Michele Tonezzer, Gianantonio Della Mea
Proceedings Volume 6585, 65851T (2007) https://doi.org/10.1117/12.722879
KEYWORDS: Zinc, Optical sensing, Atmospheric optics, FT-IR spectroscopy, Atomic force microscopy, Chemical analysis, Bioalcohols, Ocean optics, Molecules, Coating

Proceedings Article | 20 December 2001 Paper
Piergiorgio Nicolosi, Alessandro Patelli, Maria-Guglielmina Pelizzo, Valentino Rigato, Gianluigi Maggioni, L. Depero, E. Bontempi, G. Mattei, Luca Poletto, Paolo Mazzoldi, Giuseppe Tondello
Proceedings Volume 4506, (2001) https://doi.org/10.1117/12.450947
KEYWORDS: Multilayers, Silicon, Molybdenum, Reflectivity, Mirrors, Extreme ultraviolet, Interfaces, Statistical analysis, Sputter deposition, Argon

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