Prof. Gijs Bosman Profile

Prof. Gijs Bosman

at Univ of Florida

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 24 February 2009 Paper

1/f noise in single-walled carbon nanotube films

Ashkan Behnam, Gijs Bosman, Ant Ural

Proceedings Volume 7204, 72040J (2009) https://doi.org/10.1117/12.807407

KEYWORDS: Resistance, Monte Carlo methods, Single walled carbon nanotubes, Semiconductors, Computer simulations, Sensors, Optoelectronic devices, Instrument modeling, Thin films, Physics

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Proceedings Article | 8 June 2007 Open Access

Assessing the 1/f noise contributions of accidental defects in advanced semiconductor devices

Gijs Bosman, Derek Martin, Shahed Reza

Proceedings Volume 6600, 66000A (2007) https://doi.org/10.1117/12.724471

KEYWORDS: Silicon, Oxides, Resistance, Denoising, Electrodes, Semiconducting wafers, Bismuth, Field effect transistors, Semiconductors, Nanowires

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Proceedings Article | 23 May 2005 Paper

Image guided noise tomography for increased specificity of magnetic resonance imaging

Shahed Reza, Gijs Bosman, George Duensing, Feng Huang, Charles Saylor

Proceedings Volume 5841, (2005) https://doi.org/10.1117/12.609561

KEYWORDS: Magnetic resonance imaging, Image segmentation, Tumors, Interference (communication), Breast, Tomography, Tissues, Amplifiers, Image processing algorithms and systems, MATLAB

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Proceedings Article | 12 May 2003 Paper

Computer simulation and reverse engineering of trap-assisted generation-recombination noise in advanced silicon MOSFETs

Gijs Bosman, Fan-Chi Hou, Derek Martin, Juan Sanchez

Proceedings Volume 5113, (2003) https://doi.org/10.1117/12.497127

KEYWORDS: Oxides, Field effect transistors, Computer simulations, Reverse engineering, Silicon, Device simulation, Doping, Interfaces, Interference (communication), Reverse modeling

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Conference Committee Involvement (1)

Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems

23 October 2005 | Boston, MA, United States

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