Dr. Gisele Bennett Profile

Dr. Gisele Bennett

at MEPSS LLC

SPIE Involvement:

Conference Program Committee | Author

Area of Expertise:

superresolution imaging , Imaging through turbulence , Wave propagation

SPIE Journal Paper | 26 October 2012

Special Section Guest Editorial: Imaging through the Atmosphere

Gisele Bennett

OE Vol. 51 Issue 10

KEYWORDS: Light scattering, Atmospheric optics, Imaging systems, Scattering, Atmospheric modeling, Earth's atmosphere, Turbulence, Electro optical modeling, Molecules, Absorption

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Proceedings Article | 4 May 2007 Paper

Improved night vision demonstrator program status

Terence Haran, J. Christopher James, David Roberts, Michael Knotts, Anthony Wasilewski, Leanne West, William Robinson, Gisele Bennett

Proc. SPIE. 6538, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense VI

KEYWORDS: Signal to noise ratio, CMOS sensors, Eye, Sensors, Image processing, Image resolution, Wavefronts, Night vision, Image sensors, Contrast transfer function

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Proceedings Article | 8 June 2005 Paper

Wigner tools in optical system analysis, design, and simulation

William Rhodes, J. James, Gisele Bennett

Proc. SPIE. 5827, Opto-Ireland 2005: Photonic Engineering

KEYWORDS: Optical design, Imaging systems, Spatial frequencies, Fourier transforms, Numerical simulations, Optical analysis, Wave propagation, Free space optics, Wigner distribution functions, Light wave propagation

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Proceedings Article | 19 November 2003 Paper

Nonuniform sampling of coherence functions produced by incoherent 3-D sources

Jonathan James, Gisele Welch, William Rhodes

Proc. SPIE. 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life

KEYWORDS: Optical imaging, Coherence imaging, Statistical analysis, Coherence (optics), Imaging systems, Time metrology, Nonuniform sampling

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SPIE Journal Paper | 1 August 2003

Information differences between subbands of the mid-wave infrared spectrum

Steve Moyer, Ronald Driggers, Richard Vollmerhausen, Michael Soel, Gisele Welch, William Rhodes

OE Vol. 42 Issue 08

KEYWORDS: Sensors, Optical filters, Black bodies, Image segmentation, Mid-IR, Atmospheric optics, Signal to noise ratio, Image filtering, Imaging systems, Target detection

Proceedings Article | 29 July 2002 Paper

Mid-wave infrared target source characteristics for focal plane applications

Steven Moyer, Ronald Driggers, Richard Vollmerhausen, Michael Soel, Penny Warren, Gisele Welch, William Rhodes

Proc. SPIE. 4719, Infrared and Passive Millimeter-wave Imaging Systems: Design, Analysis, Modeling, and Testing

KEYWORDS: Signal to noise ratio, Infrared sensors, Mid-IR, Optical filters, Imaging systems, Sensors, Calibration, Image segmentation, Black bodies, Atmospheric optics

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Proceedings Article | 22 January 2002 Paper

Image reconstruction by spatio-temporal coherence transfer

Gisele Welch, William Rhodes

Proc. SPIE. 4489, Free-Space Laser Communication and Laser Imaging

KEYWORDS: Mirrors, Super resolution, Coherence (optics), Backscatter, Imaging systems, Scattering, Image restoration, Image acquisition, Diffusers, Transmittance

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Proceedings Article | 2 June 1999

Remote imaging by transfer of coherence functions through optical fibers

William Rhodes, Gisele Welch

Proc. SPIE. 10296, 1999 Euro-American Workshop Optoelectronic Information Processing: A Critical Review

KEYWORDS: Optical fibers, Coherence (optics), Imaging systems, Spatial frequencies, Light scattering, Image acquisition, Optoelectronics, Data processing, Image transmission, RGB color model

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Proceedings Article | 22 May 1998 Paper

Nonimaging optical methods for measuring Fourier components of moving incoherently illuminated objects

William Rhodes, Gisele Welch, Hakan Urey

Proc. SPIE. 3490, Optics in Computing '98

KEYWORDS: Fringe analysis, Modulation, Imaging systems, Spatial frequencies, Sensors, Inspection, Fourier transforms, Phase shift keying, Signal detection, Nonimaging optics

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Showing 5 of 9 publications

Conference Committee Involvement (19)

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIII

3 April 2022 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXII

12 April 2021 | Online Only, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI

27 April 2020 | Online Only, California, United States

Electro-Optical and Infrared Systems: Technology and Applications XVI

11 September 2019 | Strasbourg, France

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX

16 April 2019 | Baltimore, Maryland, United States

Electro-Optical and Infrared Systems: Technology and Applications

12 September 2018 | Berlin, Germany

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX

17 April 2018 | Orlando, Florida, United States

Electro-Optical and Infrared Systems: Technology and Applications

13 September 2017 | Warsaw, Poland

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII

11 April 2017 | Anaheim, California, United States

Electro-Optical and Infrared Systems: Technology and Applications

28 September 2016 | Edinburgh, United Kingdom

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII

19 April 2016 | Baltimore, Maryland, United States

Electro-Optical and Infrared Systems: Technology and Applications

22 September 2015 | Toulouse, France

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI

21 April 2015 | Baltimore, Maryland, United States

Electro-Optical and Infrared Systems: Technology and Applications

23 September 2014 | Amsterdam, Netherlands

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV

6 May 2014 | Baltimore, Maryland, United States

Electro-Optical and Infrared Systems: Technology and Applications X

23 September 2013 | Dresden, Germany

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV

30 April 2013 | Baltimore, Maryland, United States

Electro-Optical and Infrared Systems: Technology and Applications

25 September 2012 | Edinburgh, United Kingdom

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII

24 April 2012 | Baltimore, Maryland, United States

Showing 5 of 19 Conference Committees

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