Dr. Guido Schriever
at MPI für Dynamik und Selbstorganisation
SPIE Involvement:
Author
Publications (26)

SPIE Journal Paper | 29 May 2012
Guido Schriever, Olivier Semprez, Jeroen Jonkers, Masaki Yoshioka, Rolf Apetz
JM3, Vol. 11, Issue 02, 021104, (May 2012) https://doi.org/10.1117/12.10.1117/1.JMM.11.2.021104
KEYWORDS: Tin, Plasma, Extreme ultraviolet, Gas lasers, Extreme ultraviolet lithography, Photons, Mirrors, Light sources, Pulsed laser operation, Carbon monoxide

Proceedings Article | 20 March 2010 Paper
Proceedings Volume 7636, 763610 (2010) https://doi.org/10.1117/12.846545
KEYWORDS: Extreme ultraviolet, Tin, Scanners, Extreme ultraviolet lithography, Plasma, Ultraviolet radiation, Reliability, Semiconducting wafers, Lithography, Electrodes

Proceedings Article | 18 March 2009 Paper
G. Bianucci, G. L. Cassol, J. Kools, M. Prea, G. Salmaso, G. Valsecchi, F. Zocchi, D. Bolshukhin, M. Schürmann, G. Schriever, A. Mader, P. Zink
Proceedings Volume 7271, 72710C (2009) https://doi.org/10.1117/12.813652
KEYWORDS: Mirrors, Extreme ultraviolet, Reflectivity, Ruthenium, Extreme ultraviolet lithography, Optics manufacturing, EUV optics, Optical design, Integrated optics, Solids

Proceedings Article | 18 March 2009 Paper
Masaki Yoshioka, Denis Bolshukhin, Marc Corthout, Günther Derra, Sven Götze, Jeroen Jonkers, Jürgen Kleinschmidt, Rainer Müller, Max Schürmann, Guido Schriever, Rob Snijkers, Peter Zink
Proceedings Volume 7271, 727109 (2009) https://doi.org/10.1117/12.814100
KEYWORDS: Extreme ultraviolet lithography, Extreme ultraviolet, Xenon, Plasma, Tin, Integrated optics, Scanners, Curtains, Electrodes, Reliability

Proceedings Article | 4 December 2008 Paper
Proceedings Volume 7140, 71401F (2008) https://doi.org/10.1117/12.804687
KEYWORDS: Extreme ultraviolet, Extreme ultraviolet lithography, Scanners, Tin, Plasma, Xenon, Energy efficiency, Electrodes, Capacitors, Prototyping

Showing 5 of 26 publications
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