Dr. Guojin Feng
at National Institute of Metrology
SPIE Involvement:
Author
Publications (22)

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Reflection, Bidirectional reflectance transmission function, Femtosecond phenomena, Sensors, Laser systems engineering, Optical parametric oscillators, Harmonic generation, Mode locking, Pulsed laser operation, Silicon

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Diffuse reflectance spectroscopy, Integrating spheres, Reflectivity, Metrology, Mid-IR, Gold, Light sources and illumination, Remote sensing, Aerospace engineering, Black bodies

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Calibration, Spectroscopy, Spectral calibration, Lamps, Optical filters, Digital filtering, Data centers

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11438, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
KEYWORDS: Black bodies, Photometry, Integrating spheres, Optical spheres

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11337, AOPC 2019: Optical Spectroscopy and Imaging
KEYWORDS: Infrared radiation, Optical simulations, FT-IR spectroscopy

Showing 5 of 22 publications
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