Reticle systems are considered to be the classical approach for estimating the position of a target in a considered field of view and are widely used in IR seekers and trackers. This type of seeker is most suitable for tracking airborne targets such as aircraft and missiles. With an image processing system, where the reticle pattern as well as the received radiation are described as digitized images of rather high resolution, simulations can easily be performed. The method can be used for the simulation of systems with spinning reticles as well as of systems utilizing fixed reticles with an off-axis rotating lens or mirror. In this manner any arbitrary reticle pattern can be studied and the pattern can be easily altered. Simulations were performed using a TERAGON® 4200 image processing system. The simulation method and the possible signal processing methods for different types of reticle systems are described. These systems are mainly used as seekers in surface-to-air or air-to-air missiles. The simulation model presented has been used in threat analysis and in studies on the effects of various types of countermeasures, e.g., flares and jammers. The result of the simulated reticle output signals has been validated by the use of different reticle seeker hardware.
Reticle systems are considered to be the classical approach in estimating the position of a target in a considered field of view and are widely used in infrared seekers and trackers. This type of seeker is most suitable for tracking airborne targets such as aircrafts and missiles. For simulation of reticle systems a number of different methods can be used. The relationship between the detector signal u(t), the scene radiance in the reticle plane s(x,t) and the reticle transmission r(x,t) can be expressed as: u(t) equals (integral) Ar(x,t) (DOT) s(x,t)dx. By using an image processing system where the reticle pattern as well as the received radiation are described as digitized images of rather high resolution, simulations can easily be performed. The method can be used for simulation of systems with spinning reticles as well as for systems utilizing fixed reticles with off-axis rotation lens or mirror. Any arbitrary reticle pattern can be studied and the pattern can easily be altered. The simulations have been performed by using a TERAGONTM 4200 image processing system. This paper will describe the simulation method and present a number of examples.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.