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Hai Reznik
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Publications (1)
Proceedings Article | 25 April 2008 Paper
Integration and characterization of spin on dielectric materials in image sensor devices
Hai Reznik, Ruth Shima Edelstein, Michal Shach-Caplan, Fabian Dulberg, Vladimir Kamenetsky, Kimmo Karaste, Juha Rantala
Proceedings Volume 7001, 70010C (2008) https://doi.org/10.1117/12.786380
KEYWORDS: Thin film coatings, Refractive index, Dielectrics, Microlens, Image sensors, Waveguides, FT-IR spectroscopy, Polymers, Etching, Semiconducting wafers
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