Haifang Wang
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 November 2009 Paper
Haifang Wang, Yi Li, Xiaojing Yu, Huiqun Zhu, Yize Huang, Hu Zhang, Wei Zhang
Proceedings Volume 7509, 75090P (2009) https://doi.org/10.1117/12.837452
KEYWORDS: Thin films, Vanadium, Refractive index, Transmittance, Sputter deposition, Reflectivity, Infrared radiation, Dispersion, Glasses, Sapphire

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