Prof. HaiYan Zhang Profile

Prof. HaiYan Zhang

at Shanghai Institute of Technical Physics

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Author

Publications (6)

Proceedings Article | 30 August 2017 Presentation + Paper

Life test of the InGaAs focal plane arrays detector for space applications

Xian-Liang Zhu, Hai-Yan Zhang, Xue Li, Zhang-Cheng Huang, Hai-Mei Gong

Proceedings Volume 10404, 104040E (2017) https://doi.org/10.1117/12.2273591

KEYWORDS: Indium gallium arsenide, Infrared detectors, Accelerated life testing, Staring arrays, Reliability, Sensors, Infrared radiation, Readout integrated circuits, Indium, Infrared detection

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Proceedings Article | 11 September 2013 Paper

Design of the in-situ testing system for the accelerated life test of the space infrared device

Xianliang Zhu, Haiyan Zhang, Yang Wang, Xiangrong He, Haimei Gong

Proceedings Volume 8907, 890750 (2013) https://doi.org/10.1117/12.2034897

KEYWORDS: Accelerated life testing, Infrared detectors, Infrared radiation, Black bodies, Signal detection, Sensors, Reliability, Statistical analysis, Infrared imaging, Failure analysis

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Proceedings Article | 15 October 2012 Paper

The study of selective heating of indium bump in MCT infrared focal plane array

Haiyan Zhang, Lan Cao, Fulong Zhuang, Xiaoning Hu, Haimei Gong

Proceedings Volume 8419, 84192L (2012) https://doi.org/10.1117/12.976828

KEYWORDS: Indium, Staring arrays, Infrared radiation, Silicon, Electromagnetism, Mercury cadmium telluride, Infrared imaging, Reliability, Packaging, Semiconductor materials

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Proceedings Article | 15 October 2012 Paper

An automatic measuring system for the lifetime testing of infrared detectors

Lan Cao, Haiyan Zhang, Xianliang Zhu, Haimei Gong

Proceedings Volume 8419, 84191O (2012) https://doi.org/10.1117/12.975762

KEYWORDS: Sensors, Infrared detectors, Resistance, Switches, Data acquisition, Photonic integrated circuits, LabVIEW, Computer programming, Control systems, Infrared sensors

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Proceedings Article | 8 January 2008 Paper

Analysis of the thermal stress of IRFPA assembly using FEM

Haiyan Zhang, Huajie Lu

Proceedings Volume 6835, 68350J (2008) https://doi.org/10.1117/12.757438

KEYWORDS: Finite element methods, Staring arrays, Reliability, Sapphire, Cryogenics, Thermography, Silicon, Indium, Infrared radiation, Temperature metrology

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Proceedings Article | 10 January 2005 Paper

A preliminary study on MBE-grown HgCdTe two-color FPAs

Zhenhua Ye, Jun Wu, Xiaoning Hu, Yan Wu, Qingjun Liao, Haiyan Zhang, Jianxin Wang, Ruijun Ding, Li He

Proceedings Volume 5640, (2005) https://doi.org/10.1117/12.572167

KEYWORDS: Short wave infrared radiation, Photodiodes, Sensors, Mid-IR, Mercury cadmium telluride, Cadmium, Indium, Detector arrays, Doping, Heterojunctions

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Showing 5 of 6 publications

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