Dr. Haiyong Gan
Scientist at National Institute of Metrology
SPIE Involvement:
Author
Publications (28)

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Photodetectors, Light sources, Polarization, Silicon, Supercontinuum sources, Radiometry, Monochromators, Cryogenics

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Optical components, Metrology, Optical spheres, Radio optics, Sensors, Laser metrology

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Optical parametric oscillators, Femtosecond phenomena, Reflection, Sensors, Mode locking, Silicon, Bidirectional reflectance transmission function, Harmonic generation, Pulsed laser operation, Laser systems engineering

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Light sources, Indium gallium arsenide, Metrology, Radio optics, Calibration, Photodiodes, Spectral calibration, Radiometry, Monochromators, Cryogenics

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Photon counting, Imaging systems, Cameras, Sensors, Calibration, Quantum efficiency, Digital cameras, Photonics systems, Spectral calibration, Integrating spheres

Showing 5 of 28 publications
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