Dr. Hao Zhang
at Zhengzhou Information Science and Technology Insti
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 July 2013 Paper
Hao Zhang, Xijian Ping
Proceedings Volume 8878, 887847 (2013) https://doi.org/10.1117/12.2031619
KEYWORDS: Silicon, Steganalysis, Calibration, Americium, Infrared ROIC, Feature extraction, Detection and tracking algorithms, Steganography, Digital imaging, Data modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top