Prof. Yongying Yang Profile

Prof. Yongying Yang

at Zhejiang Univ

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 15 June 2020 Paper

Simulation design of dark-field imaging scene for optical spherical surface imperfection based on raytracing

Pengfei Zhang, Yongying Yang, Danhui Zhang

Proceedings Volume 11523, 1152306 (2020) https://doi.org/10.1117/12.2574761

KEYWORDS: Monte Carlo methods, Spherical lenses, Ray tracing, Inspection, Geometrical optics, Light sources, Cameras, Optical imaging, Scattering, Microscopes

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Proceedings Article | 15 June 2020 Paper

Design of SiN waveguide reference wave source for point diffraction interferometer

Yuankai Chen, Yongying Yang, Chen Wang, Yao Li, Zijian Liang, Hongyang Zhao, Shengan Liu, Jian Bai

Proceedings Volume 11523, 115230F (2020) https://doi.org/10.1117/12.2574760

KEYWORDS: Waveguides, Spherical lenses, Transmittance, Single mode fibers, Point diffraction interferometers, Silicon, Silica, Light wave propagation, Photovoltaics, Interferometers

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Proceedings Article | 15 June 2020 Paper

Electromagnetic simulation model of microscopic scattering dark-field imaging for optical components surface defect detection

Weimin Lou, Pin Cao, Haotian Hu, Zichen Lu, Yongying Yang

Proceedings Volume 11523, 1152305 (2020) https://doi.org/10.1117/12.2574758

KEYWORDS: Light scattering, Optical components, Electromagnetic simulation, Scattering, Electromagnetic scattering, Defect detection, Optical imaging, Diffraction, Finite-difference time-domain method, Cameras

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Proceedings Article | 24 October 2017 Paper

Testing of an off-axis parabolic mirror based on hybrid compensation technology

Lisong Yan, Donglin Ma, Ximeng Han, Yongliang Jiang, Li Qiang, Weicai Xu, Yulei Wang, Yongying Yang, Dong Liu

Proceedings Volume 10463, 1046314 (2017) https://doi.org/10.1117/12.2284389

KEYWORDS: Off axis mirrors, Mirrors

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Proceedings Article | 28 October 2016 Paper

Error analysis of spherical scanning mechanism used for surface defects detection

Haoliang Xiong, Yongying Yang, Chen Li, Huiting Chai, Wenlin Xv, Kai Yan, Lin Zhou, Yang Li, Yihui Zhang, Dong Liu, Jian Bai, Yibing Shen, Pin Cao

Proceedings Volume 9683, 96831U (2016) https://doi.org/10.1117/12.2243267

KEYWORDS: Error analysis, Spherical lenses, Defect detection, Monte Carlo methods, Imaging systems, Ions, Statistical analysis, Optical components, Charge-coupled devices, Matrices

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