Harlan F. Chung
Sr Process Engineer
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 5 November 2005 Paper
S. Banerjee, C.C. Lin, S. Su, C. Bowers, H.F. Chung, W. Brandt, K. Tang
Proceedings Volume 5992, 59921H (2005) https://doi.org/10.1117/12.632226
KEYWORDS: Particles, Cryogenics, Carbon monoxide, Atmospheric particles, Photomasks, Semiconducting wafers, Aerosols, Silicon, Inspection, Air contamination

Proceedings Article | 28 June 2005 Paper
S. Banerjee, C. Lin, S. Su, H. Chung, W. Brandt, K. Tang
Proceedings Volume 5853, (2005) https://doi.org/10.1117/12.617081
KEYWORDS: Particles, Atmospheric particles, Cryogenics, Photomasks, Aerosols, Semiconducting wafers, Carbon dioxide, Silicon, Atmospheric modeling, Air contamination

Proceedings Article | 10 January 1997 Paper
David Bour, Ross Bringans, Harlan Chung, David Treat, Werner Goetz, Daniel Hofstetter, Noble Johnson
Proceedings Volume 3000, (1997) https://doi.org/10.1117/12.263491
KEYWORDS: Quantum wells, Semiconductor lasers, Nonimpact printing, Light emitting diodes, Printing, Heterojunctions, Gallium nitride, Cladding, Indium gallium nitride, Optical pumping

Proceedings Article | 1 May 1990 Paper
Steven Macomber, Jeffrey Mott, Harlan Chung, Thomas Paoli
Proceedings Volume 1219, (1990) https://doi.org/10.1117/12.18259
KEYWORDS: Gold, Laser applications, Continuous wave operation, Silicon, Fabry–Perot interferometers, Resistance, Coating, Copper, Crystals

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