Dr. Haruhiko Ohashi
at JASRI/SPring-8
SPIE Involvement:
Conference Program Committee | Conference Chair | Editor | Author
Publications (44)

Proceedings Article | 15 September 2020 Presentation + Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Optical components, Mirrors, X-ray optics, Reflection, Crystals, X-rays, Silicon, Liquid crystals, Monochromators, Hard x-rays

Proceedings Article | 4 September 2020 Presentation + Paper
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Mirrors, Light sources, X-ray optics, X-rays, Solids, Freeform optics, Optics manufacturing, Precision optics

Proceedings Article | 22 August 2020 Presentation
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Mirrors, X-ray optics, Interferometers, X-rays, Complex systems, Nonlinear optics, Spatial coherence, X-ray lasers, Tolerancing, Free electron lasers

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Mirrors, X-ray optics, Precision measurement, Profilometers, Spatial resolution, X-ray imaging

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Diffraction, Mirrors, Light sources, X-ray optics, X-rays, X-ray diffraction, X-ray microscopy, Reflectivity, X-ray imaging

Showing 5 of 44 publications
Proceedings Volume Editor (5)

SPIE Conference Volume | 18 September 2020

SPIE Conference Volume | 4 October 2019

SPIE Conference Volume | 27 October 2017

SPIE Conference Volume | 5 December 2016

SPIE Conference Volume | 7 October 2014

Conference Committee Involvement (10)
Advances in X-Ray/EUV Optics and Components XVI
1 August 2021 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XV
26 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in X-Ray/EUV Optics and Components XIV
14 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Showing 5 of 10 Conference Committees
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