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Hazem M. Hajj
Technology Development Lead at Intel Corp
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Publications (4)
Proceedings Article | 30 October 2007 Paper
Intel's AMT enables rapid processing and info-turn for Intel's DFM test chip vehicle
Proceedings Volume 6730, 67300Q (2007) https://doi.org/10.1117/12.746844
KEYWORDS: Manufacturing, Computer aided design, Design for manufacturability, Design for manufacturing, Process control, Semiconducting wafers, Control systems, Transistors, Metrology, Chemical elements
Proceedings Article | 1 July 2003 Paper
Process control systems integrated for future process technologies
Proceedings Volume 5044, (2003) https://doi.org/10.1117/12.485311
KEYWORDS: Process control, Data modeling, Control systems, Semiconducting wafers, Standards development, Computer architecture, System integration, Manufacturing, Statistical analysis, Databases
Proceedings Article | 23 October 1996 Paper
2D multirate Bayesian framework for multiscale feature detection
Hazem Hajj, Truong Nguyen, Roland Chin
Proceedings Volume 2825, (1996) https://doi.org/10.1117/12.255244
KEYWORDS: Sensors, Signal detection, Edge detection, Electronic filtering, Signal to noise ratio, Interference (communication), Detection and tracking algorithms, Image processing, Error analysis, Image filtering
Proceedings Article | 18 August 1995 Paper
Machine vision system for high-speed discrete parts inspection
Sateesha Nadabar, Hazem Hajj, Reddiar Anbalagan
Proceedings Volume 2622, (1995) https://doi.org/10.1117/12.216858
KEYWORDS: Inspection, Cameras, Image processing, Imaging systems, Light sources and illumination, Discrete inspection, Machine vision, Image acquisition, Line scan cameras, Digital signal processing
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