Prof. Heidi Ottevaere
Professor at Vrije Univ Brussel
SPIE Involvement:
Conference Program Committee | Author
Publications (90)

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11548, Optical Design and Testing X
KEYWORDS: Signal to noise ratio, Short wave infrared radiation, Diffraction, Optical design, Image segmentation, Spectroscopy, Ultraviolet radiation, Spectrometer engineering, Prototyping, Diffraction gratings

Proceedings Article | 24 August 2017 Presentation + Paper
Proc. SPIE. 10377, Optical System Alignment, Tolerancing, and Verification XI
KEYWORDS: Confocal microscopy, Reflectors, Point-of-care devices, Polymers, Raman spectroscopy, Lab on a chip, Optical simulations, Raman scattering, Signal detection, Spectroscopes

Proceedings Article | 26 June 2017 Paper
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Diffraction, Diamond turning, X-ray optics, Polishing, Point diffraction interferometers, Interferometers, Manufacturing, Inspection, Interferometry, Wavefronts, Optical testing, Precision optics, Surface finishing, EUV optics

Proceedings Article | 27 September 2016 Presentation + Paper
Proc. SPIE. 9947, Current Developments in Lens Design and Optical Engineering XVII
KEYWORDS: Reflectors, Microfluidics, Gaussian beams, Polymethylmethacrylate, Particles, Raman spectroscopy, Optical tweezers, Raman scattering, Signal detection, Urea

Proceedings Article | 27 September 2016 Presentation + Paper
Proc. SPIE. 9971, Applications of Digital Image Processing XXXIX
KEYWORDS: Chromatic aberrations, Microlens array, Imaging systems, Lenses, Image resolution, Image quality, Image sensors, Modulation transfer functions, Multichannel imaging systems, Channel projecting optics

Showing 5 of 90 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 18 August 2005

Conference Committee Involvement (9)
Optical Methods for Inspection, Characterization, and Imaging of Biomaterials V
21 June 2021 | Munich, Germany
Optics and Photonics for Advanced Dimensional Metrology
6 April 2020 | Online Only, France
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Optical Micro- and Nanometrology
5 April 2016 | Brussels, Belgium
Optical Micro- and Nanometrology
15 April 2014 | Brussels, Belgium
Showing 5 of 9 Conference Committees
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