Dr. Hendrik F. Hamann
Senior Manager for Physical Analytics at IBM Thomas J Watson Research Ctr
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 February 2012 Paper
Hendrik Hamann, Snorri Ingvarsson, Levente Klein, Alice Beauny, Pauline Renoux
Proceedings Volume 8261, 82610I (2012) https://doi.org/10.1117/12.904965
KEYWORDS: Bolometers, Resistance, Silica, Platinum, Semiconducting wafers, Infrared radiation, Infrared sensors, Thermography, Black bodies, Nanowires

Proceedings Article | 9 May 2005 Paper
Proceedings Volume 5766, (2005) https://doi.org/10.1117/12.607421
KEYWORDS: Scattering, Near field, Near field scanning optical microscopy, Data modeling, Picosecond phenomena, Light scattering, Atomic force microscopy, Microscopes, Signal detection, Optical spheres

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