Henk A. Lensen
Project Manager at TNO Defense Security and Safety
SPIE Involvement:
Author
Publications (16)

Proceedings Article | 4 November 2020 Presentation + Paper
Proc. SPIE. 11517, Extreme Ultraviolet Lithography 2020
KEYWORDS: Semiconductors, Reticles, Contamination, Scanners, X-rays, Photomasks, Integrated circuits, Extreme ultraviolet lithography, Semiconducting wafers, Ruthenium

Proceedings Article | 23 March 2020 Paper
Proc. SPIE. 11323, Extreme Ultraviolet (EUV) Lithography XI
KEYWORDS: Thermography, Mirrors, Imaging systems, Reflectivity, Diagnostics, Pellicles, Reflectometry, Extreme ultraviolet, Extreme ultraviolet lithography, Diffraction gratings

Proceedings Article | 5 May 2010 Paper
Proc. SPIE. 7666, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense IX
KEYWORDS: Target detection, Image fusion, Detection and tracking algorithms, Cameras, Sensors, Image processing, Image sensors, Electro optical sensors, Electro optical systems, Environmental sensing

Proceedings Article | 24 September 2009 Paper
Proc. SPIE. 7481, Electro-Optical and Infrared Systems: Technology and Applications VI
KEYWORDS: Target detection, Radar, Image fusion, Infrared imaging, Imaging systems, Cameras, Sensors, Infrared radiation, Image enhancement, Panoramic photography

Proceedings Article | 5 May 2009 Paper
Proc. SPIE. 7305, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense VIII
KEYWORDS: Target detection, Radar, Image fusion, Infrared imaging, Imaging systems, Cameras, Sensors, Infrared radiation, Image enhancement, Panoramic photography

Showing 5 of 16 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top