Henri Speck
at Fraunhofer-IOF
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 26 September 2020
OE Vol. 59 Issue 09

Proceedings Article | 21 April 2020 Paper
Proc. SPIE. 11397, Dimensional Optical Metrology and Inspection for Practical Applications IX
KEYWORDS: Near infrared, Light sources, Modulation, Cameras, Sensors, Image processing, Field programmable gate arrays, 3D metrology, Projection systems, Freeform optics, 3D image processing

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