Prof. Hernando R. Altamar-Mercado Profile

Prof. Hernando R. Altamar-Mercado

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Publications (4)

Proceedings Article | 31 May 2022 Presentation + Paper

Optimal window selection for obtaining an extended-depth-of-focus image from white light interference microscopy images

Hernando Altamar-Mercado, Alberto Patiño-Vanegas, Andres Marrugo

Proceedings Volume 12098, 1209809 (2022) https://doi.org/10.1117/12.2618958

KEYWORDS: Image quality, Signal to noise ratio, Electronic filtering, Optical filters, 3D image processing, Microscopes, Image resolution, Digital holography, Microscopy, Reflectivity

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Proceedings Article | 19 May 2020 Presentation + Paper

Toward the generation of reproducible synthetic surface data in optical metrology

Jesus Pineda, Hernando Altamar-Mercado, Lenny Romero, Andrés Marrugo

Proceedings Volume 11397, 113970C (2020) https://doi.org/10.1117/12.2558730

KEYWORDS: Microscopy, Microscopes, Reflectivity, 3D modeling, Interferometry, Objectives, Optical metrology, Surface roughness, Sensors, Mirrors, Computer simulations

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Proceedings Article | 13 May 2019 Paper

Toward an automatic 3D measurement of skin wheals from skin prick tests

Andrés Marrugo, Lenny Romero, Jesus Pineda, Raúl Vargas, Hernando Altamar-Mercado, Javier Marrugo, Jaime Meneses

Proceedings Volume 10991, 1099104 (2019) https://doi.org/10.1117/12.2519034

KEYWORDS: Skin, Calibration, Cameras, 3D modeling, 3D metrology, Imaging systems, Fringe analysis, 3D image processing, Dermatology, Profilometers, 3D acquisition, 3D imaging metrology, Medical diagnostic instruments

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Proceedings Article | 21 October 2004 Paper

Analysis of variations of the thickness-phase objects by lateral shearing interferometry and white light scanning interferometry

Hernando Altamar, Arturo Plata

Proceedings Volume 5622, (2004) https://doi.org/10.1117/12.591957

KEYWORDS: Interferometry, Wavefronts, Interferometers, Calibration, Microscopes, Glasses, Microscopy, Laser optics, Optical interferometry, Inspection

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