Hideaki Takano
at Tokyo Seimitsu Co Ltd
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 1 April 2005
Norihiko Samoto, Akira Yoshida, Hideaki Takano, Akihiro Endo, Toyoji Fukui
JM3, Vol. 4, Issue 02, 023008, (April 2005) https://doi.org/10.1117/12.10.1117/1.1898063
KEYWORDS: Photomasks, Semiconducting wafers, Charged-particle lithography, Electron beams, Optical alignment, Distortion, Electron beam lithography, Wafer-level optics, Projection lithography, Scanners

Proceedings Article | 20 May 2004 Paper
Norifumi Nakajima, Takuji Atarashi, Hiroyuki Sakai, Toyoji Fukui, Hideaki Takano, Daizo Amano
Proceedings Volume 5374, (2004) https://doi.org/10.1117/12.536229
KEYWORDS: Photomasks, Distortion, Semiconducting wafers, Charged-particle lithography, Optical alignment, Electron beam lithography, Electron beams, Microscopes, CCD image sensors, Lithography

Proceedings Article | 20 May 2004 Paper
Norihiko Samoto, Hideaki Takano, Akihiro Endo, Akira Yoshida, Toyoji Fukui
Proceedings Volume 5374, (2004) https://doi.org/10.1117/12.535109
KEYWORDS: Photomasks, Semiconducting wafers, Charged-particle lithography, Optical alignment, Electron beams, Lithography, Scanners, Data corrections, Electron beam lithography, Distortion

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