Hideki Yagi
at Tokyo Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 April 2005 Paper
Shigehisa Arai, Hideki Yagi, Kazuya Ohira, Takeo Maruyama, Shigeo Tamura
Proceedings Volume 5738, (2005) https://doi.org/10.1117/12.597127
KEYWORDS: Laser damage threshold, Scanning electron microscopy, Quantum efficiency, Interfaces, Waveguides, Reflectivity, Semiconducting wafers, Lithography, Gallium, Semiconductor lasers

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