Dr. Hinderk M. Buss
at SIGMA-C Software AG
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 March 2006 Paper
Christian Kalus, Hinderk Buß, Peter Brooker
Proceedings Volume 6154, 61541S (2006) https://doi.org/10.1117/12.654770
KEYWORDS: Mathematical modeling, Lithography, Diffusion, Optical lithography, Photoresist materials, Systems modeling, Process modeling, Differential equations, Calibration, Finite element methods

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