Hiroshi Kosimizu
at NTT Advanced Technology Corp.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 February 2019 Presentation + Paper
S. Tomaru, Y. Murakoshi, M. Michiguchi, H. Kohno, K. Yamauchi, H. Kosimizu, A. Yamauchi, J. Nakamura
Proceedings Volume 10915, 109150R (2019) https://doi.org/10.1117/12.2512019
KEYWORDS: Refractive index, Thin films, Ultraviolet radiation, Adhesives, Transparency, Chemical elements, Optical components, Glasses

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