Hiroshi Tsukada
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 129551B (2024) https://doi.org/10.1117/12.3010113
KEYWORDS: X-rays, Microscopes, Metals, X-ray imaging, Reflection, Mirrors, Multilayers, Transmittance, Silicon, Nondestructive evaluation

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11611, 116110U (2021) https://doi.org/10.1117/12.2582070
KEYWORDS: X-rays, 3D metrology, X-ray imaging, Scattering, Process control, Nondestructive evaluation, 3D modeling, X-ray diffraction, Shape analysis, Semiconductors

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