Hiroyuki Tanizaki
at KIOXIA Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11611, 116110U (2021) https://doi.org/10.1117/12.2582070
KEYWORDS: X-rays, 3D metrology, X-ray imaging, Scattering, Process control, Nondestructive evaluation, 3D modeling, X-ray diffraction, Shape analysis, Semiconductors

Proceedings Article | 20 August 2004 Paper
Proceedings Volume 5446, (2004) https://doi.org/10.1117/12.557725
KEYWORDS: Inspection, Sensors, Photomasks, Image sensors, Reticles, Light sources, Point spread functions, Image processing, Computer aided design, Phase shifting

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