While photomask prices continue to increase and their lifetime continues to be shortened due to molecular
contamination, it is a key issue to understand the chemical mechanism of the mask damage caused by haze problem to
save fabrication cost. We show a unique method for in-situ Airborne Molecular Contamination, or AMC, measurement
in the mask carrier mini-environment as well as the small volume confined under the pellicle protective film.
Additionally, an ultimate solution to decontaminate the photomask and surrounding environment with a vacuum purging
system shows preliminary positive results on the extension of photomask life time by elimination of the haze problem
cause.
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