Hisanori Sugimachi
Process Engineer at Tokyo Electron Europe Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 April 2009 Paper
Hisanori Sugimachi, Hitoshi Kosugi, Tsuyoshi Shibata, Junichi Kitano, Koichi Fujiwara, Kouji Itou, Michihiro Mita, Akimasa Soyano, Shiro Kusumoto, Motoyuki Shima, Yoshikazu Yamaguchi
Proceedings Volume 7273, 72731D (2009) https://doi.org/10.1117/12.814033
KEYWORDS: Photoresist processing, Critical dimension metrology, Line width roughness, Lithography, Coating, Double patterning technology, Semiconducting wafers, Factor analysis, Etching, Neodymium

Proceedings Article | 1 April 2008 Paper
Jo Finders, Eddy Van der Heijden, Gert-Jan Janssen, Rik Vangheluwe, Tsuysohi Shibata, Ryouichirou Naitou, Hitoshi Kosugi, Hisanori Sugimachi
Proceedings Volume 6924, 69242Y (2008) https://doi.org/10.1117/12.773595
KEYWORDS: Reticles, Optical proximity correction, Printing, Lithographic illumination, Photoresist processing, Critical dimension metrology, Semiconducting wafers, Lithography, Scanning electron microscopy, Double patterning technology

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